%0 Journal Article %1 journals/tcad/SinghK93 %A Singh, Adit D. %A Krishna, C. Mani %D 1993 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 5 %P 695-709 %T On optimizing VLSI testing for product quality using die-yield prediction. %U http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#SinghK93 %V 12

@article{journals/tcad/SinghK93, added-at = {2022-09-10T00:00:00.000+0200}, author = {Singh, Adit D. and Krishna, C. Mani}, biburl = {https://www.bibsonomy.org/bibtex/2604a8edf9b6d592bb0583b9dd12c5987/dblp}, ee = {https://doi.org/10.1109/43.277614}, interhash = {eba6260898d12e6addcdb5d1fffc4a6f}, intrahash = {604a8edf9b6d592bb0583b9dd12c5987}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 5, pages = {695-709}, timestamp = {2024-04-08T19:45:25.000+0200}, title = {On optimizing VLSI testing for product quality using die-yield prediction.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad12.html#SinghK93}, volume = 12, year = 1993 }