%0 Journal Article %1 journals/et/AhmedWUA12 %A ud-din Ahmed, Badar %A Wang, Youren %A Ullah, Rizwan %A ud-din Ahmed, Najam %D 2012 %J J. Electron. Test. %K dblp %N 4 %P 535-540 %T A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection. %U http://dblp.uni-trier.de/db/journals/et/et28.html#AhmedWUA12 %V 28

@article{journals/et/AhmedWUA12, added-at = {2020-09-11T00:00:00.000+0200}, author = {ud-din Ahmed, Badar and Wang, Youren and Ullah, Rizwan and ud-din Ahmed, Najam}, biburl = {https://www.bibsonomy.org/bibtex/22ec029b170a4aeef3a485883d1a8d425/dblp}, ee = {https://doi.org/10.1007/s10836-012-5311-6}, interhash = {fd04867d041a912883ebeb4152af44e9}, intrahash = {2ec029b170a4aeef3a485883d1a8d425}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 4, pages = {535-540}, timestamp = {2020-09-12T11:41:17.000+0200}, title = {A Novel TOPSIS-Based Test Vector Compaction Technique for Analog Fault Detection.}, url = {http://dblp.uni-trier.de/db/journals/et/et28.html#AhmedWUA12}, volume = 28, year = 2012 }