%0 Conference Paper %1 conf/vts/NeubauerBRR0018 %A Neubauer, Felix %A Burchard, Jan %A Raiola, Pascal %A Rivoir, Jochen %A Becker, Bernd %A Sauer, Matthias %B VTS %D 2018 %I IEEE Computer Society %K %P 1-6 %T Efficient generation of parametric test conditions for AMS chips with an interval constraint solver. %U http://dblp.uni-trier.de/db/conf/vts/vts2018.html#NeubauerBRR0018 %@ 978-1-5386-3774-6

@inproceedings{conf/vts/NeubauerBRR0018, added-at = {2023-12-12T19:32:19.000+0100}, author = {Neubauer, Felix and Burchard, Jan and Raiola, Pascal and Rivoir, Jochen and Becker, Bernd and Sauer, Matthias}, biburl = {https://www.bibsonomy.org/bibtex/2436b2d3b8f0a1cb885a0b99770238bff/admin}, booktitle = {VTS}, crossref = {conf/vts/2018}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2018.8368645}, interhash = {223c448ac060ab6ac9fcb3accd277aa0}, intrahash = {436b2d3b8f0a1cb885a0b99770238bff}, isbn = {978-1-5386-3774-6}, keywords = {}, pages = {1-6}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T19:32:19.000+0100}, title = {Efficient generation of parametric test conditions for AMS chips with an interval constraint solver.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2018.html#NeubauerBRR0018}, year = 2018 }