%0 Conference Paper %1 conf/ats/ErbSSRB14 %A Erb, Dominik %A Scheibler, Karsten %A Sauer, Matthias %A Reddy, Sudhakar M. %A Becker, Bernd %B ATS %D 2014 %I IEEE Computer Society %K dblp %P 131-136 %T Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects. %U http://dblp.uni-trier.de/db/conf/ats/ats2014.html#ErbSSRB14 %@ 978-1-4799-6030-9

@inproceedings{conf/ats/ErbSSRB14, added-at = {2023-03-24T00:00:00.000+0100}, author = {Erb, Dominik and Scheibler, Karsten and Sauer, Matthias and Reddy, Sudhakar M. and Becker, Bernd}, biburl = {https://www.bibsonomy.org/bibtex/27080292bb34a8971d50f47a042ce3377/dblp}, booktitle = {ATS}, crossref = {conf/ats/2014}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2014.34}, interhash = {56b8ea190cb980dc963167181100a69d}, intrahash = {7080292bb34a8971d50f47a042ce3377}, isbn = {978-1-4799-6030-9}, keywords = {dblp}, pages = {131-136}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:14.000+0200}, title = {Circuit Parameter Independent Test Pattern Generation for Interconnect Open Defects.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2014.html#ErbSSRB14}, year = 2014 }