%0 Journal Article %1 journals/mr/MohammadS08 %A Mohammad, Mohammad Gh. %A Saluja, Kewal K. %D 2008 %J Microelectron. Reliab. %K dblp %N 5 %P 698-709 %T Analysis and test procedures for NOR flash memory defects. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#MohammadS08 %V 48

@article{journals/mr/MohammadS08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Mohammad, Mohammad Gh. and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/24c3ba3d5228838bbd1eed45d6d521777/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.01.004}, interhash = {d5f1f287e47130bc7ce1f3aba3013682}, intrahash = {4c3ba3d5228838bbd1eed45d6d521777}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 5, pages = {698-709}, timestamp = {2020-02-25T13:25:23.000+0100}, title = {Analysis and test procedures for NOR flash memory defects.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#MohammadS08}, volume = 48, year = 2008 }