%0 Journal Article %1 journals/mr/SuneWJL03 %A Suñé, Jordi %A Wu, Ernest Y. %A Jiménez, David %A Lai, Wing L. %D 2003 %J Microelectron. Reliab. %K dblp %N 8 %P 1185-1192 %T Statistics of soft and hard breakdown in thin SiO2 gate oxides. %U http://dblp.uni-trier.de/db/journals/mr/mr43.html#SuneWJL03 %V 43

@article{journals/mr/SuneWJL03, added-at = {2020-02-22T00:00:00.000+0100}, author = {Suñé, Jordi and Wu, Ernest Y. and Jiménez, David and Lai, Wing L.}, biburl = {https://www.bibsonomy.org/bibtex/2927bf54093330d67e9d367c9b90a70a5/dblp}, ee = {https://doi.org/10.1016/S0026-2714(03)00170-7}, interhash = {e2ac7b7c1e4aec0bdb7fda7cfe7410bb}, intrahash = {927bf54093330d67e9d367c9b90a70a5}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1185-1192}, timestamp = {2020-02-25T13:28:53.000+0100}, title = {Statistics of soft and hard breakdown in thin SiO2 gate oxides.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr43.html#SuneWJL03}, volume = 43, year = 2003 }