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Disambiguation of "Suñé, Jordi"

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Statistics of soft and hard breakdown in thin SiO2 gate oxides.

, , , and . Microelectron. Reliab., 43 (8): 1185-1192 (2003)

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Alexander Jording

Guido Jordine

Jordi Serangeli

Jordi Serratosa

Ulrich Jordi

 

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Identification of the generation/rupture mechanism of filamentary conductive paths in ReRAM devices using oxide failure analysis., , , , and . Microelectron. Reliab., (2017)Voltage-Driven Hysteresis Model for Resistive Switching: SPICE Modeling and Circuit Applications., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (12): 2044-2051 (2017)Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition., , , , and . IEEE Access, (2020)Equivalent circuit modeling of the bistable conduction characteristics in electroformed thin dielectric films., , , , and . Microelectron. Reliab., 55 (1): 1-14 (2015)Electrical characterization of multiple leakage current paths in HfO2/Al2O3-based nanolaminates., , , , and . Microelectron. Reliab., 55 (9-10): 1442-1445 (2015)Field-effect control of breakdown paths in HfO2 based MIM structures., , , , , , and . Microelectron. Reliab., 53 (9-11): 1346-1350 (2013)Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition., , , , , and . LASCAS, page 1-4. IEEE, (2021)Equivalent circuit model for the electron transport in 2D resistive switching material systems., , , , , and . ESSDERC, page 86-89. IEEE, (2017)A new method for estimating the conductive filament temperature in OxRAM devices based on escape rate theory., , , and . Microelectron. Reliab., (2018)Statistics of soft and hard breakdown in thin SiO2 gate oxides., , , and . Microelectron. Reliab., 43 (8): 1185-1192 (2003)