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Disambiguation of "Funaki, Tsuyoshi"

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SiC JFET dc characteristics under extremely high ambient temperatures.

, , , , , , , and . IEICE Electron. Express, 1 (17): 523-527 (2004)

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Shuku Funaki

Tsuyoshi Takagi

Tsuyoshi Matsuda

 

Other publications of authors with the same name

A study of SiC Power BJT performance and robustness., , , , , and . Microelectron. Reliab., 51 (9-11): 1773-1777 (2011)Simple circuit model of SiC pin diode composed by using experimental electrical characteristics., , , and . IEICE Electron. Express, 2 (13): 392-398 (2005)An experimental study on estimating dynamic junction temperature of SiC MOSFET., and . IEICE Electron. Express, 15 (8): 20180251 (2018)Switching surge voltage suppression in SiC half-bridge module with double side conducting ceramic substrate and snubber capacitor., and . IEICE Electron. Express, 14 (11): 20170177 (2017)Visualization of noise current propagation in a power module with scanning time-synchronized near magnetic field measurement., , and . IEICE Electron. Express, 15 (18): 20180669 (2018)Transient thermal analysis of packaged SiC SBDs for high temperature operation., and . IEICE Electron. Express, 13 (6): 20151047 (2016)A Modular Approach to Large-Signal Modeling of an Interconnected AC/MTDC System., , , , , and . ISGT-Europe, page 945-949. IEEE, (2020)The Origin of Nonlinear Phenomena in TCR-SVC Associated With Parametric Excitation of Intrinsic Oscillation and External Excitation., , and . IEEE Trans. Circuits Syst. I Regul. Pap., 55-I (9): 2952-2958 (2008)Methodology for the determination of real-time dynamic line ratings for secure operation of overhead conductors., , and . ISGT Europe, page 1-6. IEEE, (2017)Noise Suppression in SiC-MOSFET Body Diode Turn-Off Operation with Simple and Robust Gate Driver., and . IEICE Trans. Electron., 105-C (12): 750-760 (December 2022)