( en | de | ru )

 

Disambiguation of "Vannini, Giorgio"

Author of the publication

copydeleteadd this publication to your clipboard
An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime.

, , , , and . IEEE Trans. Instrumentation and Measurement, 58 (8): 2663-2670 (2009)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Natalie Vannini

Rico Vannini

Claudio Vannini

Giorgio Stefanoni

Giorgio Cortellaro

 

Other publications of authors with the same name

Impact of transistor model uncertainty on microwave load-pull simulations., , , , and . I2MTC, page 1-6. IEEE, (2017)Power amplifier ACPR simulation using standard harmonic balance tools., , and . ISCAS (5), page 401-404. IEEE, (2002)Analysis of Gate-Voltage Clipping Behavior on Class-F and Inverse Class-F Amplifiers., , , , , , , and . BCICTS, page 44-47. IEEE, (2018)An Automated Measurement System for the Characterization of Electron Device Degradation Under Nonlinear Dynamic Regime., , , , and . IEEE Trans. Instrumentation and Measurement, 58 (8): 2663-2670 (2009)Analysis of Efficiency-Limiting Factors Resulting from Transistor Current Source on Class-F and Inverse Class-F Power Amplifiers., , , , , and . IEICE Trans. Electron., 105-C (10): 449-456 (October 2022)Mathematical approaches to electron device modelling for non-linear microwave circuit design: State of the art and present trends., , and . Eur. Trans. Telecommun., 1 (6): 641-653 (1990)Analysis of the gate current as a suitable indicator for FET degradation under nonlinear dynamic regime., , , , , and . Microelectron. Reliab., 51 (2): 235-239 (2011)A new technique for thermal resistance measurement in power electron devices., , , and . IEEE Trans. Instrumentation and Measurement, 54 (5): 1921-1925 (2005)A dual-source nonlinear measurement system oriented to the empirical characterization of low-frequency dispersion in microwave electron devices., , , , , and . Comput. Stand. Interfaces, 33 (2): 165-175 (2011)