( en | de | ru )

 

Disambiguation of "Papadimitriou, Athanasios"

Author of the publication

copydeleteadd this publication to your clipboard
Laser-induced fault effects in security-dedicated circuits.

, , , , , , , , , , , , , , , , , , and . VLSI-SoC, page 1-6. IEEE, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Evripidis Papadimitriou

Georg Papadimitriou

Sofia Papadimitriou

Joannis Papadimitriou

Dimitra Papadimitriou

 

Other publications of authors with the same name

Laser-Induced Fault Effects in Security-Dedicated Circuits., , , , , , , , , and 5 other author(s). VLSI-SoC (Selected Papers), volume 464 of IFIP Advances in Information and Communication Technology, page 220-240. Springer, (2014)Cross-layer analysis of software fault models and countermeasures against hardware fault attacks in a RISC-V processor., , , , and . Microprocess. Microsystems, (2019)On the Performance of Non-Profiled Differential Deep Learning Attacks against an AES Encryption Algorithm Protected using a Correlated Noise Generation based Hiding Countermeasure., , , , and . DATE, page 614-617. IEEE, (2020)Analyzing the Impact of Approximate Adders on the Reliability of FPGA Accelerators., , and . ETS, page 1-2. IEEE, (2021)You can detect but you cannot hide: Fault Assisted Side Channel Analysis on Protected Software-based Block Ciphers., , , , and . DFT, page 1-6. IEEE, (2020)Validation of RTL laser fault injection model with respect to layout information., , , , , and . HOST, page 78-81. IEEE Computer Society, (2015)On error models for RTL security evaluations., , , , , and . DTIS, page 1-6. IEEE, (2014)Design Space Exploration for Ultra-Low-Energy and Secure IoT MCUs., , , , , and . ACM Trans. Embed. Comput. Syst., 19 (3): 19:1-19:34 (2020)Security and Reliability Evaluation of Countermeasures implemented using High-Level Synthesis., , , , and . IOLTS, page 1-8. IEEE, (2022)Laser Fault Injection at the CMOS 28 nm Technology Node: an Analysis of the Fault Model., , , , , , , , , and 3 other author(s). FDTC, page 1-6. IEEE Computer Society, (2018)