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Delta-IDDQ Testing of Resistive Short Defects.

, , , , и . ATS, стр. 63-68. IEEE, (2006)

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Piet Engelke

Piet Jonas

Piet Meerendonk

Piet Hensel

Piet Hensel

 

Другие публикации лиц с тем же именем

Funding project DIANA - Integrated diagnostics for the analysis of electronic failures in vehicles., и . European Test Symposium, стр. 1. IEEE Computer Society, (2012)Delta-IDDQ Testing of Resistive Short Defects., , , , и . ATS, стр. 63-68. IEEE, (2006)SUPERB: Simulator Utilizing Parallel Evaluation of Resistive Bridges., , , , и . ATS, стр. 433-438. IEEE, (2007)Simulating Open-Via Defects., , , , и . ATS, стр. 265-270. IEEE, (2007)BASTION: Board and SoC test instrumentation for ageing and no failure found., , , , , , , , и . DATE, стр. 115-120. IEEE, (2017)Struktureller Test im System.. Aspekte der Technischen Informatik, стр. 5-10. MV-Wissenschaft, (2014)Resistive bridging faults - defect-oriented modeling and efficient testing (Resistive bridging faults - defektorientierte Modellierung und effizienter Test). University of Freiburg, Germany, (2009)base-search.net (ftunivfreiburg:oai:freidok.uni-freiburg.de:6476).A Specific ATPG technique for Resistive Open with Sequence Recursive Dependency., , , , и . ATS, стр. 273-278. IEEE, (2006)IJTAG Through a Two-Pin Chip Interface., , , , , , , , , и . ITC, стр. 1-5. IEEE, (2020)Modeling feedback bridging faults with non-zero resistance., , , и . ETW, стр. 91-96. IEEE Computer Society, (2003)