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An Efficient Dictionary Organization for Maximum Diagnosis.

, , , and . J. Electron. Test., 22 (1): 37-48 (2006)

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A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method., , , , , , , , , and 2 other author(s). ITC, page 1-10. IEEE Computer Society, (2008)RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test., , , , and . Asian Test Symposium, page 242-247. IEEE Computer Society, (2004)An Efficient Dictionary Organization for Maximum Diagnosis., , , and . J. Electron. Test., 22 (1): 37-48 (2006)MICRO: a new hybrid test data compression/decompression scheme., , , and . IEEE Trans. Very Large Scale Integr. Syst., 14 (6): 649-654 (2006)An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR., , , and . J. Electron. Test., 24 (6): 591-595 (2008)XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults., , , , and . ATS, page 83-88. IEEE Computer Society, (2008)A new low energy BIST using a statistical code., , and . ASP-DAC, page 647-652. IEEE, (2008)DiSC: A New Diagnosis Method for Multiple Scan Chain Failures., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (12): 2051-2055 (2010)MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs., , and . J. Electron. Test., 23 (4): 357-362 (2007)A New Maximal Diagnosis Algorithm for Bus-structured Systems., , , , and . ITC, page 349-357. IEEE Computer Society, (2003)