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Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.

, , , , , , , , , , , , , , и . ISQED, стр. 580-584. IEEE, (2013)

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Mohamed Abu Taila

Mohamed Abu-Mugheisib

Mohamed Abu Saris

Omar Abu Mohamed Abu-Amna

Abu Mohamed AbuAmna

 

Другие публикации лиц с тем же именем

Variability in VLSI Circuits: Sources and Design Considerations., и . ISCAS, стр. 3215-3218. IEEE, (2007)A methodology for statistical estimation of read access yield in SRAMs., , , , , и . DAC, стр. 205-210. ACM, (2008)Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology., , , , , , , , , и 5 other автор(ы). ISQED, стр. 580-584. IEEE, (2013)A Statistical Design-Oriented Delay Variation Model Accounting for Within-Die Variations., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (11): 1983-1995 (2008)Leakage Current Variability in Nanometer Technologies, invited., и . IWSOC, стр. 60-63. IEEE Computer Society, (2005)Reducing SRAM Power Using Fine-Grained Wordline Pulsewidth Control., , и . IEEE Trans. Very Large Scale Integr. Syst., 18 (3): 356-364 (2010)Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS., , , , , , , и . CICC, стр. 1-4. IEEE, (2011)Leakage power profiling and leakage power reduction using DFT hardware., , и . VTS, стр. 46-51. IEEE Computer Society, (2011)A robust single supply voltage SRAM read assist technique using selective precharge., , и . ESSCIRC, стр. 234-237. IEEE, (2008)