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LEAP: An Accurate Defect-Free IDDQ Estimator., and . J. Electron. Test., 17 (3-4): 267-274 (2001)IDDQ Characterization in Submicron CMOS., and . ITC, page 136-145. IEEE Computer Society, (1997)Leakage power bounds in CMOS digital technologies., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 21 (6): 731-738 (2002)Characterization of leakage power in CMOS technologies., and . ICECS, page 185-188. IEEE, (1998)On estimating bounds of the quiescent current for IDDQ testin., and . VTS, page 106-111. IEEE Computer Society, (1996)IDDQ testing: state of the art and future trends., , , , and . Integr., 26 (1-2): 167-196 (1998)LEAP: An accurate defect-free IDDQ estimator., and . ETW, page 33-38. IEEE Computer Society, (2000)