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Disambiguation of "Matsushima, Jun"

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Fault-detection-strengthened method to enable the POST for very-large automotive MCU in compliance with ISO26262.

, , , , , and . ETS, page 1-2. IEEE, (2018)

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Jun Jun Lu

Meta Jun

Jun Yamamoto

Jun Li

Jun Yang

 

Other publications of authors with the same name

Automotive Functional Safety Assurance by POST with Sequential Observation., , , , and . IEEE Des. Test, 35 (3): 39-45 (2018)Test Point Insertion for Multi-Cycle Power-On Self-Test., , , , , , and . ACM Trans. Design Autom. Electr. Syst., 28 (3): 46:1-46:21 (2023)Structure-Based Methods for Selecting Fault-Detection-Strengthened FF under Multi-cycle Test with Sequential Observation., , , , , , and . ATS, page 209-214. IEEE Computer Society, (2016)A Power Reduction Method for Scan Testing in Ultra-Low Power Designs., , and . ATS, page 141. IEEE, (2021)An Effective At-Speed Scan Testing Approach Using Multiple-Timing Clock Waveforms., , , and . Asian Test Symposium, page 1. IEEE Computer Society, (2012)Multi-configuration Scan Structure for Various Purposes., and . ATS, page 131. IEEE Computer Society, (2016)CooLBIST: An Effective Approach of Test Power Reduction for LBIST., , and . ATS, page 264. IEEE Computer Society, (2008)A yield improvement methodology based on logic redundant repair with a repairable scan flip-flop designed by push rule., , , and . ISQED, page 184-190. IEEE, (2010)A Yield and Reliability Improvement Methodology Based on Logic Redundant Repair with a Repairable Scan Flip-Flop Designed by Push Rule., , , , , and . ACM Trans. Design Autom. Electr. Syst., 17 (2): 17:1-17:22 (2012)A 16 nm FinFET Heterogeneous Nona-Core SoC Supporting ISO26262 ASIL B Standard., , , , , , , and . IEEE J. Solid State Circuits, 52 (1): 77-88 (2017)