From post

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

 

Другие публикации лиц с тем же именем

Irradiation Tests for Commercial Off-the Shelf Components with Atmospheric-like Neutrons and Heavy-Ions., , , , , , , , , и 2 other автор(ы). CoRR, (2023)Neutron Irradiation Testing and Analysis of a Fault-Tolerant RISC-V System-on-Chip., , , , , , и . DFT, стр. 1-6. IEEE, (2022)Technology Impact on Neutron-Induced Effects in SDRAMs: A Comparative Study., , , , , , , и . DTIS, стр. 1-6. IEEE, (2021)An Overview of the Risk Posed by Thermal Neutrons to the Reliability of Computing Devices., , , , , , , , , и 1 other автор(ы). DSN (Supplements), стр. 92-97. IEEE, (2020)Single Event Effects Assessment of UltraScale+ MPSoC Systems Under Atmospheric Radiation., , , , , , , , , и 2 other автор(ы). IEEE Trans. Reliab., 73 (1): 771-783 (марта 2024)First Tests of a New Facility for Device-Level, Board-Level and System-Level Neutron Irradiation of Microelectronics., , , , и . IEEE Trans. Emerg. Top. Comput., 9 (1): 104-108 (2021)Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs., , , , , , и . DFT, стр. 1-6. IEEE, (2023)Thermal neutrons: a possible threat for supercomputer reliability., , , , , , , , , и 2 other автор(ы). J. Supercomput., 77 (2): 1612-1634 (2021)Single Event Effects Assessment of UltraScale+ MPSoC Systems under Atmospheric Radiation., , , , , , , , , и 2 other автор(ы). CoRR, (2023)Investigating the Impact of Radiation-Induced Soft Errors on the Reliability of Approximate Computing Systems., , , , , , , и . DFT, стр. 1-6. IEEE, (2020)