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Non-robust tests for stuck-fault detection using signal waveform analysis: feasibility and advantages.

, , , and . VTS, page 354-361. IEEE Computer Society, (1996)

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Research in Reliable VLSI Architectures at the University of Illinois.. FJCC, page 890-893. IEEE Computer Society, (1986)Design of Test Pattern Generators for Built-In Test., , and . ITC, page 315-319. IEEE Computer Society, (1984)Average Interconnection Length and Interconnection Distribution Based on Rent's Rule., and . DAC, page 574-577. ACM Press, (1989)A Novel Approach to Accurate Timing Verification Using RTL Descriptions., and . DAC, page 638-641. ACM Press, (1989)An Area Efficient On-chip Static IR Drop Detector/Evaluator., , and . ISCAS, page 2009-2012. IEEE, (2009)A low latency and low power dynamic Carry Save Adder., , , , , , , and . ISCAS (2), page 477-480. IEEE, (2004)A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems., and . ISLPED, page 391-396. IEEE/ACM, (2011)On efficient generation of instruction sequences to test for delay defects in a processor., , , and . ACM Great Lakes Symposium on VLSI, page 279-284. ACM, (2008)Delay Constrained Register Transfer Level Dynamic Power Estimation., , and . PATMOS, volume 4148 of Lecture Notes in Computer Science, page 36-46. Springer, (2006)Quantitative evaluation of soft error injection techniques for robust system design., , , , and . DAC, page 101:1-101:10. ACM, (2013)