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VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images.

, и . IJPRAI, 9 (2): 449-462 (1995)

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A BIST scheme for RTL circuits based on symbolic testabilityanalysis., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (1): 111-128 (2000)A low overhead design for testability and test generation technique for core-based systems-on-a-chip., , и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 18 (11): 1661-1676 (1999)KLOVER: Automatic Test Generation for C and C Programs, Using Symbolic Execution., , , , , , , и . IEEE Softw., 34 (5): 30-37 (2017)VLSI Implementation of An Efficient ASIC Architecture for Real-Time Rotation of Digital Images., и . IJPRAI, 9 (2): 449-462 (1995)SymJS: automatic symbolic testing of JavaScript web applications., , и . SIGSOFT FSE, стр. 449-459. ACM, (2014)Ising-Based Louvain Method: Clustering Large Graphs with Specialized Hardware., , , и . IDA, том 12695 из Lecture Notes in Computer Science, стр. 350-361. Springer, (2021)High Level Test Generation for Custom Hardware: An Industrial Perspective.. Asian Test Symposium, стр. 458. IEEE Computer Society, (2005)Automatic test pattern generation for functional register-transferlevel circuits using assignment decision diagrams., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 20 (3): 402-415 (2001)Ising-Based Louvain Method: Clustering Large Graphs with Specialized Hardware., , , и . CoRR, (2020)Automatic test pattern generation for functional RTL circuits using assignment decision diagrams., и . DAC, стр. 43-48. ACM, (2000)