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Disambiguation of "Gomez, Jhon"

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Recent Trends and Perspectives on Defect-Oriented Testing.

, , , , , , , , , , , , , , , , , , , , and . IOLTS, page 1-10. IEEE, (2022)

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Jhon Malta

Ana Gómez-Carrillo Castro

Pedro Gómez

Gerardo Gómez Gonzáles

Anne Gómez Caicoya

 

Other publications of authors with the same name

Boosting Latent Defect Coverage in Automotive Mixed-Signal ICs Using SVM Classifiers., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (10): 3426-3435 (October 2023)Recent Trends and Perspectives on Defect-Oriented Testing., , , , , , , , , and 11 other author(s). IOLTS, page 1-10. IEEE, (2022)Machine Learning-based Defect Coverage Boosting of Analog Circuits under Measurement Variations., , , , , , , and . ACM Trans. Design Autom. Electr. Syst., 25 (5): 47:1-47:27 (2020)High-coverage analog IP block test generation methodology using low-cost signal generation and output response analysis., , , , , and . ETS, page 1-4. IEEE, (2023)Quick Analyses for Improving Reliability and Functional Safety of Mixed-Signal ICs., , , , , , , and . ITC, page 1-10. IEEE, (2020)Pinhole Latent Defect Modeling and Simulation for Defect-Oriented Analog/Mixed-Signal Testing., , , , , and . VTS, page 1-6. IEEE, (2020)DDtM: Increasing Latent Defect Detection in Analog/Mixed-Signal ICs Using the Difference in Distance to Mean Value., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (11): 4771-4781 (2022)Applying Vstress and defect activation coverage to produce zero-defect mixed-signal automotive ICs., , , , , , and . ITC, page 1-4. IEEE, (2019)Latent Defect Screening with Visually-Enhanced Dynamic Part Average Testing., , , , , and . ETS, page 1-6. IEEE, (2020)Avoiding Mixed-Signal Field Returns by Outlier Detection of Hard-to-Detect Defects based on Multivariate Statistics., , , , , , , and . ETS, page 1-6. IEEE, (2020)