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Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors.

A. Lesniewska, S. Srinivasan, J. Campenhout, B. O'Sullivan, and K. Croes. IRPS, page 1-7. IEEE, (2019)

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Alicja Niedworok

Alicja Bukowska

Alicja Dolzblasz

Alicja Ossowska

Alicja Ditschek

Other publications of authors with the same name

Reliability of a DME Ru Semidamascene scheme with 16 nm wide Airgaps.A. Lesniewska, O. Pedreira, M. Lofrano, G. Murdoch, M. van der Veen, A. Dangol, N. Horiguchi, Z. Tökei, and K. Croes. IRPS, page 1-6. IEEE, (2021)Insights into metal drift induced failure in MOL and BEOL.C. Wu, O. Pedreira, A. Lesniewska, Y. Li, I. Ciofi, Z. Tökei, and K. Croes. IRPS, page 3. IEEE, (2018)Dielectric Reliability Study of 21 nm Pitch Interconnects with Barrierless Ru Fill.A. Lesniewska, P. Roussel, D. Tierno, V. Vega-Gonzalez, M. van der Veen, P. Verdonck, N. Jourdan, C. Wilson, Z. Tökei, and K. Croes. IRPS, page 1-6. IEEE, (2020)First demonstration of Two Metal Level Semi-damascene Interconnects with Fully Self-aligned Vias at 18MP.G. Murdoch, M. O'Toole, G. Marti, A. Pokhrel, D. Tsvetanova, S. Decoster, S. Kundu, Y. Oniki, A. Thiam, Q. Le and 5 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2022)Role of Defects in the Reliability of HfO2/Si-Based Spacer Dielectric Stacks for Local Interconnects.C. Wu, A. Chasin, A. Padovani, A. Lesniewska, S. Demuynck, and K. Croes. IRPS, page 1-6. IEEE, (2019)Method to assess the impact of LER and spacing variation on BEOL dielectric reliability using 2D-field simulations for <20nm spacing.D. Kocaay, P. Roussel, K. Croes, I. Ciofi, A. Lesniewska, and I. Wolf. IRPS, page 10-1. IEEE, (2018)Degradation mechanisms in Germanium Electro-Absorption Modulators.A. Tsiara, A. Lesniewska, P. Roussel, S. Srinivasan, M. Berciano, M. Simicic, M. Pantouvaki, J. Campenhout, and K. Croes. IRPS, page 9. IEEE, (2022)Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors.A. Lesniewska, S. Srinivasan, J. Campenhout, B. O'Sullivan, and K. Croes. IRPS, page 1-7. IEEE, (2019)Towards accurate temperature prediction in BEOL for reliability assessment (Invited).M. Lofrano, H. Oprins, X. Chang, B. Vermeersch, O. Pedreira, A. Lesniewska, V. Cherman, I. Ciofi, K. Croes, S. Park and 1 other author(s). IRPS, page 1-7. IEEE, (2023)Silicon Photonics for 56G NRZ Optical Interconnects.J. Campenhout, Y. Ban, P. Heyn, A. Srinivasan, J. Coster, S. Lardenois, B. Snyder, S. Balakrishnan, G. Lepage, N. Golshani and 7 other author(s). OFC, page 1-3. IEEE, (2018)

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Disambiguation of "Lesniewska, Alicja"

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Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors.

Please choose a person to relate this publication to

Alicja Niedworok

Alicja Bukowska

Alicja Dolzblasz

Alicja Ossowska

Alicja Ditschek

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lesniewska, Alicja"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors.

Please choose a person to relate this publication to

Alicja Niedworok

Alicja Bukowska

Alicja Dolzblasz

Alicja Ossowska

Alicja Ditschek

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Accelerated Device Degradation of High-Speed Ge Waveguide Photodetectors.