Author of the publication

Low distortion sine wave generator with simple harmonics cancellation circuit and filter for analog device testing.

, , , , , , , , , , , , and . IEICE Electron. Express, 20 (1): 20220470 (2023)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Ichikawa, Tamotsu
add a person with the name Ichikawa, Tamotsu
 

Other publications of authors with the same name

High Precision Voltage Measurement System Utilizing Low-End ATE Resource and BOST., , , , , , , , , and 3 other author(s). ATS, page 37-42. IEEE, (2022)Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion., , , , , , , , , and 4 other author(s). ITC, page 47-55. IEEE, (2023)Summing Node Test Method: Simultaneous Multiple AC Characteristics Testing of Multiple Operational Amplifiers., , , , , , , , , and 5 other author(s). ATS, page 1-6. IEEE, (2020)Evaluation of High-Precision Nano-Ampere Current Measurement Method for Mass Production., , , , , , , , , and 3 other author(s). ICECS, page 1-6. IEEE, (2021)Evaluation of Null Method for Operational Amplifier Short-Time Testing., , , , , , , , , and 3 other author(s). ASICON, page 1-4. IEEE, (2019)Revisit to Histogram Method for ADC Linearity Test: Examination of Input Signal and Ratio of Input and Sampling Frequencies., , , , , , , , , and 2 other author(s). J. Electron. Test., 38 (1): 21-38 (2022)Summing Node and False Summing Node Methods: Accurate Operational Amplifier AC Characteristics Testing without Audio Analyzer., , , , , , , , , and 5 other author(s). ITC, page 364-373. IEEE, (2021)Innovative Practices Track: Innovative Analog Circuit Testing Technologies., , , , , , , , , and 8 other author(s). VTS, page 1. IEEE, (2022)High Precision Measurement of Sub-Nano Ampere Current in ATE Environment., , , , , , , , , and 3 other author(s). ATS, page 139-140. IEEE, (2021)High-Resolution Low-Sampling-Rate Δ∑ ADC Linearity Short-Time Testing Algorithm., , , , , , , , , and 2 other author(s). ASICON, page 1-4. IEEE, (2019)