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On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition.

, , , and . Microelectron. Reliab., (2018)

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Compact electro-thermal modeling of a SiC MOSFET power module under short-circuit conditions., , , , and . IECON, page 4879-4884. IEEE, (2017)Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules., , , and . Microelectron. Reliab., (2018)Modern IGBT gate driving methods for enhancing reliability of high-power converters - An overview., , , , , and . Microelectron. Reliab., (2016)A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis., , , and . Microelectron. Reliab., (2017)Effect of short-circuit stress on the degradation of the SiO2 dielectric in SiC power MOSFETs., , and . Microelectron. Reliab., (2018)Impact of meteorological variations on the lifetime of grid-connected PV inverters., , , , , and . Microelectron. Reliab., (2018)Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions., , , , and . Microelectron. Reliab., (2018)Capacitive effects in IGBTs limiting their reliability under short circuit., , , and . Microelectron. Reliab., (2017)On-line solder layer degradation measurement for SiC-MOSFET modules under accelerated power cycling condition., , , and . Microelectron. Reliab., (2018)Robustness of MW-Level IGBT modules against gate oscillations under short circuit events., , , and . Microelectron. Reliab., 55 (9-10): 1950-1955 (2015)