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Improved Methods for Fault Diagnosis in Scan-Based BIST., and . LATW, page 169-172. IEEE, (2001)Deterministic partitioning techniques for fault diagnosis in scan-based BIST., and . ITC, page 273-282. IEEE Computer Society, (2000)Cache Resident Functional Microprocessor Testing: Avoiding High Speed IO Issues., , and . ITC, page 1-7. IEEE Computer Society, (2006)Highly Configurable Programmable Built-In Self Test Architecture for High-Speed Memories., , and . VTS, page 21-26. IEEE Computer Society, (2005)Seamless Test of Digital Components in Mixed-Signal Paths., , and . IEEE Des. Test Comput., 21 (1): 44-55 (2004)ChipNeMo: Domain-Adapted LLMs for Chip Design., , , , , , , , , and 27 other author(s). CoRR, (2023)An Examination of PRPG Selection Approaches for Large, Industrial Designs., , and . Asian Test Symposium, page 440-. IEEE Computer Society, (1998)Test Synthesis for Mixed-Signal SOC Paths., , and . DATE, page 128-133. IEEE Computer Society / ACM, (2000)Diagnosis for scan-based BIST: reaching deep into the signatures., and . DATE, page 102-111. IEEE Computer Society, (2001)Cost effective digital filter design for concurrent test., and . ICASSP, page 3323-3326. IEEE, (2000)