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A study of path delay variations in the presence of uncorrelated power and ground supply noise.

, , , , , and . DDECS, page 189-194. IEEE Computer Society, (2011)

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Reliability of computing systems: From flip flops to variables., , , , and . IOLTS, page 196-198. IEEE, (2017)Cross-layer reliability evaluation, moving from the hardware architecture to the system level: A CLERECO EU project overview., , , , , , , , , and 1 other author(s). Microprocess. Microsystems, 39 (8): 1204-1214 (2015)Computing reliability: On the differences between software testing and software fault injection techniques., , , , , and . Microprocess. Microsystems, (2017)Effect-cause intra-cell diagnosis at transistor level., , , , , , and . ISQED, page 460-467. IEEE, (2013)Multi-Objective Application-Driven Approximate Design Method., , , and . IEEE Access, (2021)Resilience-Performance Tradeoff Analysis of a Deep Neural Network Accelerator., , , , , and . DDECS, page 181-186. IEEE, (2023)AdequateDL: Approximating Deep Learning Accelerators., , , , , , and . DDECS, page 37-40. IEEE, (2021)Selective Hardening of Critical Neurons in Deep Neural Networks., , , , , and . DDECS, page 136-141. IEEE, (2022)Fast Bridging Fault Diagnosis using Logic Information., , , , , and . ATS, page 33-38. IEEE, (2007)Emerging Computing Devices: Challenges and Opportunities for Test and Reliability*., , , , , , , , , and 2 other author(s). ETS, page 1-10. IEEE, (2021)