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Adjusting for Autocorrelated Errors in Neural Networks for Time Series.

, , and . NeurIPS, page 29806-29819. (2021)

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Semiconductor wafer representation for TCAD., , , , , , , , , and 2 other author(s). IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 13 (1): 82-95 (1994)Nominality Score Conditioned Time Series Anomaly Detection by Point/Sequential Reconstruction., , , , and . CoRR, (2023)The Effects of Process Variations and BTI in Packaged FinFET Devices., , and . IRPS, page 1-5. IEEE, (2023)A 12b 50MS/s 2.1mW SAR ADC with redundancy and digital background calibration., , and . ESSCIRC, page 109-112. IEEE, (2013)Robust Deep Reinforcement Learning against Adversarial Perturbations on State Observations., , , , , , and . NeurIPS, (2020)NeurOLight: A Physics-Agnostic Neural Operator Enabling Parametric Photonic Device Simulation., , , , , , and . NeurIPS, (2022)Towards Stable and Efficient Training of Verifiably Robust Neural Networks., , , , , , , and . ICLR, OpenReview.net, (2020)Linking TCAD to EDA - Benefits and Issues., , , , , and . DAC, page 573-578. ACM, (1991)Redundancy in SAR ADCs., , and . ACM Great Lakes Symposium on VLSI, page 283-288. ACM, (2011)An integrated technology CAD system for process and device designers., , and . IEEE Trans. Very Large Scale Integr. Syst., 1 (4): 482-490 (1993)