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Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits.

, , , and . ICCAD, page 795-802. IEEE, (2013)

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Fast statistical analysis of rare failure events for memory circuits in high-dimensional variation space., and . ASP-DAC, page 302-307. IEEE, (2015)Structure-aware high-dimensional performance modeling for analog and mixed-signal circuits., , and . CICC, page 1-4. IEEE, (2013)Bayesian model fusion: a statistical framework for efficient pre-silicon validation and post-silicon tuning of complex analog and mixed-signal circuits., , , and . ICCAD, page 795-802. IEEE, (2013)Efficient SRAM Failure Rate Prediction via Gibbs Sampling., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (12): 1831-1844 (2012)Fast statistical analysis of rare circuit failure events via scaled-sigma sampling for high-dimensional variation space., , , , and . ICCAD, page 478-485. IEEE, (2013)Machine Learning for Noise Sensor Placement and Full-Chip Voltage Emergency Detection., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 36 (3): 421-434 (2017)Indirect Performance Sensing for On-Chip Self-Healing of Analog and RF Circuits., , , , , , , , , and 4 other author(s). IEEE Trans. Circuits Syst. I Regul. Pap., 61-I (8): 2243-2252 (2014)Indirect performance sensing for on-chip analog self-healing via Bayesian model fusion., , , , , , , , , and 4 other author(s). CICC, page 1-4. IEEE, (2013)Bayesian Model Fusion: Large-Scale Performance Modeling of Analog and Mixed-Signal Circuits by Reusing Early-Stage Data., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (8): 1255-1268 (2016)Nonlinear Dynamic Modeling and Model Reduction Strategy for Rotating Thin Cylindrical Shells., and . Complex., (2019)