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Disambiguation of "Aikyo, Takashi"

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Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects.

, , , , , , , , , and . ATS, page 139-146. IEEE, (2006)

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Takashi Seki

Takashi Iwata

Takashi Numaguchi

Takashi Tsuno

Takashi Ohtsuki

 

Other publications of authors with the same name

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate., , , , , , , and . IEICE Trans. Inf. Syst., 91-D (3): 726-735 (2008)Test Roles in Diagnosis and Silicon Debug., , , , , , and . ATS, page 367. IEEE, (2007)ATREX : Design for Testability System for Mega Gate LSIs., , , , , and . Asian Test Symposium, page 126-. IEEE Computer Society, (1997)Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing., , , , , , , , and . IEICE Trans. Inf. Syst., 94-D (6): 1216-1226 (2011)A Study of Capture-Safe Test Generation Flow for At-Speed Testing., , , , , , , , , and 1 other author(s). IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 93-A (7): 1309-1318 (2010)Small Delay Fault Model for Intra-Gate Resistive Open Defects., , , , , , and . VTS, page 27-32. IEEE Computer Society, (2009)Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau.. DFT, page 227. IEEE Computer Society, (2010)A Test Synthesis Approach to Reducing BALLAST DFT Overhead., , , , and . DAC, page 466-471. ACM Press, (1997)Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects., , , , , , , , , and . ATS, page 139-146. IEEE, (2006)Test Data Compression of 100x for Scan-Based BIST., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)