Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Exploring the inherent fault tolerance of successive approximation algorithms under laser fault injection., , , and . LATS, page 1-6. IEEE, (2018)Cross-layer system reliability assessment framework for hardware faults., , , , , , , , , and 4 other author(s). ITC, page 1-10. IEEE, (2016)An effective fault-injection framework for memory reliability enhancement perspectives., , , , and . DTIS, page 1-6. IEEE, (2017)Setting test conditions for improving SRAM reliability., , , , , , and . European Test Symposium, page 257. IEEE Computer Society, (2010)A Heuristic Exploration of Retraining-free Weight-Sharing for CNN Compression., , , and . ASP-DAC, page 134-139. IEEE, (2022)Exploiting Approximate Computing for Efficient and Reliable Convolutional Neural Networks., , and . ISVLSI, page 326. IEEE, (2022)Exploiting approximate computing for low-cost fault tolerant architectures., , , , and . SBCCI, page 3. ACM, (2019)A Comprehensive Analysis of Transition Fault Coverage and Test Power Dissipation for Launch-Off-Shift and Launch-Off-Capture Schemes., , , , , , , , and . J. Low Power Electron., 6 (2): 359-374 (2010)Formal Design Space Exploration for memristor-based crossbar architecture., , and . DDECS, page 145-150. IEEE, (2017)Analysis and Fault Modeling of Actual Resistive Defects in ATMEL TSTACTM eFlash Memories., , , , , , , , and . J. Electron. Test., 28 (2): 215-228 (2012)