( en | de | ru )

 

Disambiguation of "Vardanian, Valery A."

Author of the publication

copydeleteadd this publication to your clipboard
Minimal March Tests for Detection of Dynamic Faults in Random Access Memories.

, , and . J. Electron. Test., 23 (1): 55-74 (2007)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Valery Makhavikou

Valéry Schmid

Valery Kardanov

Valery Radchenko

Valery Stojanow

 

Other publications of authors with the same name

Minimal March Tests for Detection of Dynamic Faults in Random Access Memories., , and . J. Electron. Test., 23 (1): 55-74 (2007)On completely robust path delay fault testable realization of logic functions.. VTS, page 302-307. IEEE Computer Society, (1996)An Efficient March-Based Three-Phase Fault Location and Full Diagnosis Algorithm for Realistic Two-Operation Dynamic Faults in Random Access Memories., , and . VTS, page 95-100. IEEE Computer Society, (2008)Minimal March-Based Fault Location Algorithm with Partial Diagnosis for all Static Faults in Random Access Memories., , and . DDECS, page 262-267. IEEE Computer Society, (2006)Impact of process variations on read failures in SRAMs., , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)An efficient fault diagnosis and localization algorithm for Successive-Approximation Analog to Digital Converters., , , , and . EWDTS, page 1-4. IEEE Computer Society, (2013)Impact of Soft Error Challenge on SoC Design., , , and . IOLTS, page 63-68. IEEE Computer Society, (2005)A March-Based Fault Location Algorithm for Static Random Access Memories., and . MTDT, page 62-67. IEEE Computer Society, (2002)SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure., , and . IEEE Des. Test Comput., 21 (3): 200-207 (2004)Generic BIST architecture for testing of content addressable memories., , , , and . IOLTS, page 86-91. IEEE Computer Society, (2011)