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A 64-Kb 0.37V 28nm 10T-SRAM with mixed-Vth read-port and boosted WL scheme for IoT applications.

, , , , , , , and . A-SSCC, page 185-188. IEEE, (2016)

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17.2 A 64kb 16nm asynchronous disturb current free 2-port SRAM with PMOS pass-gates for FinFET technologies., , , , , , , , , and 2 other author(s). ISSCC, page 1-3. IEEE, (2015)A 20nm 112Mb SRAM in High-к metal-gate with assist circuitry for low-leakage and low-VMIN applications., , , , , , , , , and 5 other author(s). ISSCC, page 316-317. IEEE, (2013)A 16 nm 128 Mb SRAM in High-κ Metal-Gate FinFET Technology With Write-Assist Circuitry for Low-VMIN Applications., , , , , , , , , and 2 other author(s). IEEE J. Solid State Circuits, 50 (1): 170-177 (2015)A 3nm 256Mb SRAM in FinFET Technology with New Array Banking Architecture and Write-Assist Circuitry Scheme for High-Density and Low-VMIN Applications., , , , , , , , , and 8 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)A 4nm 6163-TOPS/W/b $4790-TOPS/mm^2/b$ SRAM Based Digital-Computing-in-Memory Macro Supporting Bit-Width Flexibility and Simultaneous MAC and Weight Update., , , , , , , , , and 8 other author(s). ISSCC, page 132-133. IEEE, (2023)A 64-Kb 0.37V 28nm 10T-SRAM with mixed-Vth read-port and boosted WL scheme for IoT applications., , , , , , , and . A-SSCC, page 185-188. IEEE, (2016)13.5 A 16nm 128Mb SRAM in high-κ metal-gate FinFET technology with write-assist circuitry for low-VMIN applications., , , , , , , , , and 4 other author(s). ISSCC, page 238-239. IEEE, (2014)A 5-nm 254-TOPS/W 221-TOPS/mm2 Fully-Digital Computing-in-Memory Macro Supporting Wide-Range Dynamic-Voltage-Frequency Scaling and Simultaneous MAC and Write Operations., , , , , , , , , and 8 other author(s). ISSCC, page 1-3. IEEE, (2022)34.4 A 3nm, 32.5TOPS/W, 55.0TOPS/mm2 and 3.78Mb/mm2 Fully-Digital Compute-in-Memory Macro Supporting INT12 × INT12 with a Parallel-MAC Architecture and Foundry 6T-SRAM Bit Cell., , , , , , , , , and 13 other author(s). ISSCC, page 572-574. IEEE, (2024)A 16nm dual-port SRAM with partial suppressed word-line, dummy read recovery and negative bit-line circuitries for low VMIN applications., , , , , , and . VLSI Circuits, page 1-2. IEEE, (2016)