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True sparse PCA for reducing the number of essential sensors in virtual metrology.

, , , , и . Int. J. Prod. Res., 62 (6): 2142-2157 (марта 2024)

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Myong-Kee Jeong

Myong Ja Jung-Baek

Su-Jeong Jeong

Wonrae Jeong

Hyung-Gon Jeong

 

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