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Modeling and analysis of traffic light controller using Statechart.

, , and . SMC, page 557-562. IEEE, (2010)

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Automatic Die Inspection for Post-sawing LED Wafers., , , and . SMC, page 1615-1620. IEEE, (2009)Telematics gateway and power saving method for electric vehicles., , and . SMC, page 780-785. IEEE, (2011)Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection., , and . CASE, page 301-306. IEEE, (2005)Diagnosability Enhancement of Discrete Event Systems., , and . SMC, page 4096-4101. IEEE, (2006)Separation model design of manufacturing systems using the distributed agent-oriented Petri net., , , and . Int. J. Computer Integrated Manufacturing, 18 (2&3): 146-157 (2005)Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing., , and . ICRA, page 5301-5306. IEEE, (2004)AN overview of semiconductor fab automation systems., and . ICRA, page 1050-1055. IEEE, (2003)Synthesis using resource control nets for modeling shared-resource systems., and . IEEE Trans. Robotics Autom., 11 (3): 317-327 (1995)An unsupervised neural network approach for automatic semiconductor wafer defect inspection., , , and . Expert Syst. Appl., 36 (1): 950-958 (2009)Computationally Improved Optimal Control Methodology for Linear Programming Problems of Flexible Manufacturing Systems., , , , and . J. Appl. Math., (2013)