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Power-aware voltage tuning for STT-MRAM reliability.

, , , , , , и . ETS, стр. 1-6. IEEE, (2015)

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Elena I Rugarli

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Claudia Ines Elena Theissen

 

Другие публикации лиц с тем же именем

Robustness analysis of 6T SRAMs in memory retention mode under PVT variations., и . DATE, стр. 980-985. IEEE, (2011)Transient Noise Failures in SRAM Cells: Dynamic Noise Margin Metric., , , и . Asian Test Symposium, стр. 413-418. IEEE Computer Society, (2011)Nonvolatile memories: Present and future challenges., , и . IDT, стр. 61-66. IEEE, (2014)Rebooting Computing: The Challenges for Test and Reliability., , , , , , , , , и . DFT, стр. 8138-8143. IEEE, (2019)Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation., и . DATE, стр. 1343-1348. IEEE, (2012)Integration of STT-MRAM model into CACTI simulator., , , , , и . IDT, стр. 67-72. IEEE, (2014)Power-aware voltage tuning for STT-MRAM reliability., , , , , , и . ETS, стр. 1-6. IEEE, (2015)Parametric failure analysis of embedded SRAMs using fast & accurate dynamic analysis., , , и . ETS, стр. 69-74. IEEE Computer Society, (2010)Analyzing resistive-open defects in SRAM core-cell under the effect of process variability., , , , , , и . ETS, стр. 1-6. IEEE Computer Society, (2013)Analyzing the effect of concurrent variability in the core cells and sense amplifiers on SRAM read access failures., , , , , , и . DTIS, стр. 39-44. IEEE, (2013)