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Diagnosis and Layout Aware (DLA) Scan Chain Stitching., , , , , , , , , and 5 other author(s). IEEE Trans. Very Large Scale Integr. Syst., 23 (3): 466-479 (2015)STDF Memory Fail Datalog Standard., , , , , , , , , and . VTS, page 209-214. IEEE Computer Society, (2009)Adaptive Multidimensional Parallel Fault Simulation Framework on Heterogeneous System., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 42 (6): 1951-1964 (June 2023)Parallel Static Learning Toward Heterogeneous Computing Architectures., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 43 (3): 983-993 (March 2024)Signature Based Diagnosis for Logic BIST., , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Logic BIST with Scan Chain Segmentation., , , and . ITC, page 57-66. IEEE Computer Society, (2004)Detection and Diagnosis of Static Scan Cell Internal Defect., , , and . ITC, page 1-10. IEEE Computer Society, (2008)GPGPU-Based ATPG System: Myth or Reality?, , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 39 (1): 239-247 (2020)X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis., , , , , , , and . IEEE Des. Test Comput., 24 (5): 476-485 (2007)GPU-based Hybrid Parallel Logic Simulation for Scan Patterns., , , and . ITC-Asia, page 118-123. IEEE, (2020)