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Parallel Pseudorandom Sequences for Built-In Test., and . ITC, page 302-308. IEEE Computer Society, (1984)Random Pattern Testability., , and . IEEE Trans. Computers, 33 (1): 79-90 (1984)On Random Pattern Test Length., and . ITC, page 95-107. IEEE Computer Society, (1983)Built-In Self-Test: Milestones and Challenges., and . VLSI Design, 1 (1): 23-44 (1993)Discrete logarithms a parallel pseudorandom pattern generator analysis method.. J. Electron. Test., 3 (1): 17-31 (1992)Calculating the effects of linear dependencies in m-sequences used as test stimuli.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 11 (1): 83-86 (1992)Production Experience with Built-In Self-Test in the IBM ES/9000 System., and . ITC, page 28-36. IEEE Computer Society, (1991)Primitive polynomials of degree 301 through 500.. J. Electron. Test., 3 (2): 175-176 (1992)Self-Testing of Multichip Logic Modules., and . ITC, page 200-204. IEEE Computer Society, (1982)Random Testing for Stuck-At Storage Cells in an Embedded Memory., , and . ITC, page 157-166. IEEE Computer Society, (1984)