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Security, Reliability and Test Aspects of the RISC-V Ecosystem.

J. Abella, S. Alcaide, J. Anders, F. Bas, S. Becker, E. Mulder, N. Elhamawy, F. Gürkaynak, H. Handschuh, C. Hernández, M. Hutter, L. Kosmidis, I. Polian, M. Sauer, S. Wagner, and F. Regazzoni. ETS, page 1-10. IEEE, (2021)

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Jens Olaf Anders

Constanze Jenschke

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A bidirectional neural interface featuring a tunable recorder and electrode impedance estimation.M. Haas, J. Anders, and M. Ortmanns. BioCAS, page 372-375. IEEE, (2016)Wide-band efficiency-enhanced CMOS rectifier.H. Xu, M. Lorenz, U. Bihr, J. Anders, and M. Ortmanns. ISCAS, page 614-617. IEEE, (2014)A bidirectional neural interface IC with high voltage compliance and spectral separation.M. Haas, U. Bihr, J. Anders, and M. Ortmanns. ISCAS, page 2743-2746. IEEE, (2016)A 5-780-MHz Transceiver ASIC for Multinuclear NMR Spectroscopy in 0.13-μm BiCMOS.F. Dreyer, D. Krüger, S. Baas, A. Velders, and J. Anders. IEEE Trans. Circuits Syst. I Regul. Pap., 70 (9): 3484-3496 (September 2023)A 0.1 MHz to 200 MHz high-voltage CMOS transceiver for portable NMR systems with a maximum output current of 2.0 App.H. Bürkle, T. Klotz, R. Krapf, and J. Anders. ESSCIRC, page 327-330. IEEE, (2021)A Portable CMOS-based MRI System with 67×67×83 µm3Image Resolution.D. Krüger, A. Zhang, H. Hinton, V. Arnal, Y. Song, Y. Tang, K. Lei, J. Anders, and D. Ham. ESSCIRC, page 225-228. IEEE, (2022)An Analog High-Speed Single-Cycle Lock-in Amplifier for Next Generation AFM Experiments.B. Schlecker, A. Nievergelt, M. Ortmanns, G. Fantner, and J. Anders. IEEE SENSORS, page 1-4. IEEE, (2018)VCO-based ESR-on-a-chip as a tool for low-cost, high-sensitivity point-of-care diagnostics.B. Schlecker, A. Chu, J. Handwerker, S. Kiinstner, M. Ortmanns, K. Lips, and J. Anders. IEEE SENSORS, page 1-3. IEEE, (2017)An IoT based low-cost heart rate measurement system employing PPG sensors.L. Gohlke, F. Dreyer, M. Álvarez, and J. Anders. IEEE SENSORS, page 1-4. IEEE, (2020)Exploring the Mysteries of System-Level Test.I. Polian, J. Anders, S. Becker, P. Bernardi, K. Chakrabarty, N. Elhamawy, M. Sauer, A. Singh, M. Reorda, and S. Wagner. ATS, page 1-6. IEEE, (2020)

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Disambiguation of "Anders, Jens"

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Security, Reliability and Test Aspects of the RISC-V Ecosystem.

Please choose a person to relate this publication to

Jens Olaf Anders

Jens Olaf Anders

Jens Olaf Anders

Jens Olaf Anders

Constanze Jenschke

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Anders, Jens"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Security, Reliability and Test Aspects of the RISC-V Ecosystem.

Please choose a person to relate this publication to

Jens Olaf Anders

Jens Olaf Anders

Jens Olaf Anders

Jens Olaf Anders

Constanze Jenschke

Other publications of authors with the same name

Disambiguation

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URL
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Chicago
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Security, Reliability and Test Aspects of the RISC-V Ecosystem.