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Single-Ended 9T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Read Performance in 22-nm FinFET Technology.

, , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (11): 2748-2752 (2015)

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Single Bit-Line 7T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Performance and Energy in 14 nm FinFET Technology., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 63-I (7): 1023-1032 (2016)Transistor-interconnect mobile system-on-chip co-design method for holistic battery energy minimization., , , , , , , , , and 1 other author(s). VLSIC, page 84-. IEEE, (2015)Sense-Amplifier-Based Flip-Flop With Transition Completion Detection for Low-Voltage Operation., , , and . IEEE Trans. Very Large Scale Integr. Syst., 26 (4): 609-620 (2018)Self-Timed Pulsed Latch for Low-Voltage Operation With Reduced Hold Time., , , and . IEEE J. Solid State Circuits, 54 (8): 2304-2315 (2019)Holistic technology optimization and key enablers for 7nm mobile SoC., , , , , , , , , and 4 other author(s). VLSIC, page 198-. IEEE, (2015)Unified Technology Optimization Platform using Integrated Analysis (UTOPIA) for holistic technology, design and system co-optimization at <= 7nm nodes., , , , , , , , , and 4 other author(s). VLSI Circuits, page 1-2. IEEE, (2016)PPAC scaling enablement for 5nm mobile SoC technology., , , , , , , , , and 7 other author(s). ESSDERC, page 240-243. IEEE, (2017)FinFET based SRAM bitcell design for 32 nm node and below., , and . Microelectron. J., 42 (3): 520-526 (2011)Single-Ended 9T SRAM Cell for Near-Threshold Voltage Operation With Enhanced Read Performance in 22-nm FinFET Technology., , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 23 (11): 2748-2752 (2015)SRAM Design for 22-nm ETSOI Technology: Selective Cell Current Boosting and Asymmetric Back-Gate Write-Assist Circuit., , , , , and . IEEE Trans. Circuits Syst. I Regul. Pap., 62-I (6): 1538-1545 (2015)