Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Synthesis of Self-Testable Controllers., and . EDAC-ETC-EUROASIC, page 580-585. IEEE Computer Society, (1994)Are Robust Circuits Really Robust?, and . DFT, page 77-77. IEEE Computer Society, (2009)Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study., , , and . DFT, page 1-6. IEEE, (2020)The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems., and . DFT, page 101-108. IEEE Computer Society, (2010)Analyzing and quantifying fault tolerance properties.. LATW, page 1. IEEE Computer Society, (2013)Fast Self-Recovering Controllers., , and . VTS, page 296-302. IEEE Computer Society, (1998)Efficient Online and Offline Testing of Embedded DRAMs., , , , and . IEEE Trans. Computers, 51 (7): 801-809 (2002)Synthese vollstaendig testbarer Schaltungen. Karlsruhe University, Germany, (1991)base-search.net (ftubkarlsruhe:oai:EVASTAR-Karlsruhe.de:25491).Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair., , and . DDECS, page 185-190. IEEE Computer Society, (2007)Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test., and . DDECS, page 35-41. IEEE, (2017)