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Disambiguation of "Hamdioui, Said"

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Exploiting PUF Variation to Detect Fault Injection Attacks.

, , , , , and . DDECS, page 74-79. IEEE, (2022)

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Said Hamdioui

Said Es-Said

Said Al-Said

Saroit Anis Said

Nawal Khurshid Said

 

Other publications of authors with the same name

ETS 2016 foreword., , , , and . ETS, page 1. IEEE, (2016)Methodology for Application-Dependent Degradation Analysis of Memory Timing., , , , , , and . DATE, page 162-167. IEEE, (2019)Reliability challenges of real-time systems in forthcoming technology nodes., , , , , and . DATE, page 129-134. EDA Consortium San Jose, CA, USA / ACM DL, (2013)Public-Key Based Authentication Architecture for IoT Devices Using PUF., , , and . CoRR, (2020)A Lightweight Architecture for Real-Time Neuronal-Spike Classification., , , , , , , , and . CoRR, (2023)System-Level Sub-20 nm Planar and FinFET CMOS Delay Modelling for Supply and Threshold Voltage Scaling Under Process Variation., , and . J. Low Power Electron., 15 (1): 1-10 (2019)Defect and Fault Modeling Framework for STT-MRAM Testing., , , , , , , and . IEEE Trans. Emerg. Top. Comput., 9 (2): 707-723 (2021)Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs., , , , , and . IEEE Trans. Computers, 71 (9): 2219-2233 (2022)Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects., , , , , and . J. Electron. Test., 37 (3): 383-394 (2021)Review of Manufacturing Process Defects and Their Effects on Memristive Devices., , , , , , , and . J. Electron. Test., 37 (4): 427-437 (2021)