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Realizing High Test Quality Goals with Smart Test Resource Usage.

, , , , , , , and . ITC, page 525-533. IEEE Computer Society, (2004)

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Built-In Self-Test for Systems on Silicon., , and . VLSI Design, page 609-610. IEEE Computer Society, (1999)On Linear Dependencies in Subspaces of LFSR-Generated Sequences., and . IEEE Trans. Computers, 45 (10): 1212-1216 (1996)High Performance Dense Ring Generators., , , and . IEEE Trans. Computers, 55 (1): 83-87 (2006)Embedded deterministic test points for compact cell-aware tests., , , , , , , , , and . ITC, page 1-8. IEEE, (2015)Self-test methodology for at-speed test of crosstalk in chip interconnects., , and . DAC, page 619-624. ACM, (2000)Embedded Deterministic Test for Low-Cost Manufacturing., , , , , and . IEEE Des. Test Comput., 20 (5): 58-66 (2003)2D Test Sequence Generators., , and . IEEE Des. Test Comput., 20 (1): 51-59 (2003)High Volume Diagnosis in Memory BIST Based on Compressed Failure Data., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 29 (3): 441-453 (2010)Ring generators - new devices for embedded test applications., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 23 (9): 1306-1320 (2004)EDT Bandwidth Management in SoC Designs., , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 31 (12): 1894-1907 (2012)