Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Testing functional faults in VLSI., and . DAC, page 384-392. ACM/IEEE, (1982)Hardware reduction in continuous checksum-based analog checkers: Algorithm and its analysis., , and . J. Electron. Test., 9 (1-2): 153-163 (1996)Accurate Online Traffic Classification with Multi-Phases Identification Methodology., , , , , and . CCNC, page 141-146. IEEE, (2008)Domain Testing Based on Character String Predicate., , and . Asian Test Symposium, page 96-101. IEEE Computer Society, (2003)An efficient BIST design using LFSR-ROM architecture., and . Asian Test Symposium, page 386-. IEEE Computer Society, (2000)A waveform simulator based on Boolean process., , , and . Asian Test Symposium, page 145-150. IEEE Computer Society, (2000)Evaluation of test generation algorithms., and . VTS, page 348-350. IEEE Computer Society, (1993)Efficient Identification of Non-Robustly Untestable Path Delay Faults., , and . ITC, page 992-997. IEEE Computer Society, (1997)A Novel NMR Structure with Concurrent Error Location Capabilities., , , and . PRDC, page 32-39. IEEE Computer Society, (1999)Pseudo-Exhaustive Testing Strategy for Large Combinational Circuits., and . Comput. Syst. Sci. Eng., 1 (4): 213-220 (1986)