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A Code-less BIST Processor for Embedded Test and in-system configuration of Boards and Systems., and . ITC, page 857-866. IEEE Computer Society, (2004)Special panel session IIB: "System validation and silicon debug - Is standardization possible?"., , , , , , and . VTS, page 1. IEEE Computer Society, (2016)Evolution of Graphics Northbridge Test and Debug Architectures Across Four Generations of AMD ASICs., , , and . IEEE Des. Test, 30 (4): 16-25 (2013)Shared I/O-cell structures: a framework for extending the IEEE 1149.1 boundary-scan standard., , and . ITC, page 980-989. IEEE Computer Society, (1998)Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?, , , , , , and . VTS, page 445-446. IEEE Computer Society, (2002)IEEE 1149.6 - A Practical Perspective., , , and . ITC, page 494-502. IEEE Computer Society, (2003)Innovative practices session 3C: Advances in silicon debug & diagnosis.. VTS, page 1. IEEE Computer Society, (2015)Scan Diagnostic Strategy for the Series 10000 Prism Workstation., and . ITC, page 987-992. IEEE Computer Society, (1988)Infrastructure IP for Configuration and Test of Boards and Systems., and . IEEE Des. Test Comput., 20 (3): 78-87 (2003)On IEEE P1500's Standard for Embedded Core Test., , , , , and . J. Electron. Test., 18 (4-5): 365-383 (2002)