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Self Recovering Controller and Datapath Codesign.

, , and . DATE, page 596-601. IEEE Computer Society / ACM, (1999)

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Pseudorandom-Pattern Test Resistance in High-Performance DSP Datapaths., and . DAC, page 813-818. ACM Press, (1996)Application specific non-volatile primary memory for embedded systems., and . CODES+ISSS, page 31-36. ACM, (2008)High durability in NAND flash memory through effective page reuse mechanisms., and . CODES+ISSS, page 205-212. ACM, (2010)Energy-effcient physically tagged caches for embedded processors with virtual memory., , and . DAC, page 17-22. ACM, (2005)A DFT approach for diagnosis and process variation-aware structural test of thermometer coded current steering DACs., and . DAC, page 851-856. ACM, (2005)Scan Cell Positioning for Boosting the Compression of Fan-Out Networks., , , and . J. Comput. Sci. Technol., 24 (5): 939-948 (2009)Guest Editorial: Special Issue on 2020 IEEE International Conference on Embedded Computer Systems: Architectures, Modeling and Simulation (SAMOS 2020)., , and . Int. J. Parallel Program., 50 (2): 187-188 (2022)Low-Power Scan Testing for Test Data Compression Using a Routing-Driven Scan Architecture., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (7): 1101-1105 (2009)Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme., and . DATE, page 63-68. IEEE Computer Society, (2010)Performance and energy efficient cache migrationapproach for thermal management in embedded systems., and . ACM Great Lakes Symposium on VLSI, page 365-368. ACM, (2010)