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Parametric yield maximization using gate sizing based on efficient statistical power and delay gradient computation.

, , , , and . ICCAD, page 1023-1028. IEEE Computer Society, (2005)

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Fast Statistical Static Timing Analysis Using Smart Monte Carlo Techniques., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 30 (6): 852-865 (2011)Statistical Performance Analysis Optimization of Digital Circuits.. University of Michigan, USA, (2008)Statistical Timing Based Optimization using Gate Sizing., , and . DATE, page 400-405. IEEE Computer Society, (2005)CAD tools for variation tolerance., and . DAC, page 766. ACM, (2005)A Novel Approach to Perform Gate-Level Yield Analysis and Optimization Considering Correlated Variations in Power and Performance., , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 27 (2): 272-285 (2008)Efficient Algorithms for Identifying the Minimum Leakage States in CMOS Combinational Logic., , and . VLSI Design, page 240-. IEEE Computer Society, (2004)A Framework for Battery-Aware Sensor Management., , , and . DATE, page 962-967. IEEE Computer Society, (2004)Implicit pseudo boolean enumeration algorithms for input vector control., and . DAC, page 767-772. ACM, (2004)Circuit optimization using statistical static timing analysis., , , and . DAC, page 321-324. ACM, (2005)A new statistical max operation for propagating skewness in statistical timing analysis., , , and . ICCAD, page 237-243. ACM, (2006)