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Mapping of Kobresia pygmaea Community Based on Umanned Aerial Vehicle Technology and Gaofen Remote Sensing Data in Alpine Meadow Grassland: A Case Study in Eastern of Qinghai-Tibetan Plateau.

B. Meng, Z. Yang, H. Yu, Y. Qin, Y. Sun, J. Zhang, J. Chen, Z. Wang, W. Zhang, M. Li, Y. Lv, and S. Yi. Remote. Sens., 13 (13): 2483 (2021)

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Jianjun Yang

Jianjun Tao

Jianjun Wang

Jianjun Feng

Jianjun Pu

Other publications of authors with the same name

A state recovery design against single-event transient in high-speed phase interpolation clock and data recovery circuit.J. wei Tan, Y. Guo, J. Chen, H. Yuan, and X. Chen. ASICON, page 339-342. IEEE, (2017)Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking.J. Zhang, L. Fang, J. Chen, S. Hou, and X. Tong. IEEE Access, (2019)Stacked Fully Convolutional Networks for Pulmonary Vessel Segmentation.Y. Wang, J. Chen, C. Liu, and Z. Mao. VCIP, page 1-4. IEEE, (2018)Booleans of triangulated solids by a boundary conforming tetrahedral mesh generation approach.Z. Xiao, J. Chen, Y. Zheng, J. Zheng, and D. Wang. Comput. Graph., (2016)Workload Management in Database Management Systems: A Taxonomy.M. Zhang, P. Martin, W. Powley, and J. Chen. IEEE Trans. Knowl. Data Eng., 30 (7): 1386-1402 (2018)Automatic surface repairing, defeaturing and meshing algorithms based on an extended B-rep.J. Chen, B. wan Cao, Y. Zheng, L. Xie, C. Li, and Z. Xiao. Adv. Eng. Softw., (2015)Research on the effect of single-event transient of an on-chip linear voltage regulator fabricated on 130 nm commercial CMOS technology.Q. Zhao, G. Yang, Y. Sun, P. Yu, J. Chen, and B. Liang. Microelectron. Reliab., (2017)The Yahoo!: cloud datastore load balancer.M. Klems, A. Silberstein, J. Chen, M. Mortazavi, S. Albert, P. Narayan, A. Tumbde, and B. Cooper. CloudDB@CIKM, page 33-40. ACM, (2012)Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation.P. Hao, S. Chen, P. Huang, J. Chen, and B. Liang. Sci. China Inf. Sci., 60 (10): 108401:1-108401:3 (2017)Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM.C. Xie, Y. Chen, J. Chen, and J. Zhang. Sci. China Inf. Sci., 62 (6): 69402:1-69402:3 (2019)

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Disambiguation of "Chen, Jianjun"