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Algorithms to compute bridging fault coverage of IDDQ test sets.

, , and . ACM Trans. Design Autom. Electr. Syst., 2 (3): 281-305 (1997)

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Efficient techniques for transition testing., , , and . ACM Trans. Design Autom. Electr. Syst., 10 (2): 258-278 (2005)Extraction Error Modeling and Automated Model Debugging in High-Performance Low Power Custom Designs., , , and . DATE, page 996-1001. IEEE Computer Society, (2005)Algorithms to compute bridging fault coverage of IDDQ test sets., , and . ACM Trans. Design Autom. Electr. Syst., 2 (3): 281-305 (1997)Efficient Transition Fault ATPG Algorithms Based on Stuck-At Test Vectors., , , and . J. Electron. Test., 19 (4): 437-445 (2003)A Study of IDDQ Subset Selection Algorithms for Bridging Faults., and . ITC, page 403-412. IEEE Computer Society, (1994)Simulation and Generation of IDDQ Tests for Bridging Faults in Combinational Circuits., and . IEEE Trans. Computers, 45 (10): 1131-1140 (1996)Fast Algorithms for Computer IDDQ Tests for Combination Circuits., and . VLSI Design, page 103-106. IEEE Computer Society, (1996)Razor: A Tool for Post-Silicon Scan ATPG Pattern Debug and Its Application., , and . VTS, page 97-102. IEEE Computer Society, (2004)Algorithms to select IDDQ measurement points to detect bridging faults., and . J. Electron. Test., 8 (3): 275-285 (1996)Design for Manufacturability and Reliability in Nano Era., and . VLSI Design, page 33-34. IEEE Computer Society, (2009)