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Disambiguation of "Chen, Weilu"

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Robust Fault Detection for Uncertain Delayed Systems With Measurement Outliers Under Stochastic Communication Protocol.

, , , , and . IEEE Trans. Signal Inf. Process. over Networks, (2022)

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Chen Chen

Chen Chen

Shih Chen Chen

Yi-Chen Chen

Chen-Loung Chen

 

Other publications of authors with the same name

Finite-time memory fault detection filter design for nonlinear discrete systems with deception attacks., , , , and . Int. J. Syst. Sci., 51 (8): 1464-1481 (2020)Robust Fault Detection for Uncertain Delayed Systems With Measurement Outliers Under Stochastic Communication Protocol., , , , and . IEEE Trans. Signal Inf. Process. over Networks, (2022)Protocol-based fault detection for state-saturated systems with sensor nonlinearities and redundant channels., , , , and . Appl. Math. Comput., (2024)Variance-constrained filtering for discrete-time genetic regulatory networks with state delay and random measurement delay., , , and . Int. J. Systems Science, 50 (2): 231-243 (2019)Robust Fault Detection for Nonlinear Discrete Systems with Data Drift and Randomly Occurring Faults Under Weighted Try-Once-Discard Protocol., , , , and . CSSP, 39 (1): 111-137 (2020)Protocol-Based Fault Detection for Discrete Delayed Systems With Missing Measurements: The Uncertain Missing Probability Case., , , and . IEEE Access, (2018)Annulus-event-based fault detection for state-saturated nonlinear systems with time-varying delays., , , , and . J. Frankl. Inst., 358 (15): 8061-8084 (2021)Event-triggered finite-time fault detection for delayed networked systems with conic-type nonlinearity and deception attacks., , , and . J. Frankl. Inst., 360 (3): 1768-1791 (February 2023)An Event-Triggered Approach to Robust Fault Detection for Nonlinear Uncertain Markovian Jump Systems with Time-Varying Delays., , , , and . Circuits Syst. Signal Process., 39 (7): 3445-3469 (2020)Design of Protocol-Based Finite-Time Memory Fault Detection Scheme With Circuit System Application., , , , and . IEEE Trans. Syst. Man Cybern. Syst., 54 (5): 3110-3123 (May 2024)