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A Low-Loss Built-In Current Sensor., and . J. Electron. Test., 14 (1-2): 39-48 (1999)Development of FF Circuits for Measures Against Power Supply Noise., , and . IOLTS, page 48-51. IEEE, (2019)Dual Edge Triggered Flip-Flops for Noise Blocking and Application to Signal Delay Detection., and . Asian Test Symposium, page 119-124. IEEE Computer Society, (2012)Simulation of resistive bridging fault to minimize the presence of intermediate voltage and oscillation in CMOS circuits., , and . Asian Test Symposium, page 120-124. IEEE Computer Society, (2000)Current Testable Design of Resistor String DACs., , , , and . ATS, page 399-403. IEEE, (2007)Hybrid Rocket Engine Design Using Pairwise Ranking Surrogate-assisted Differential Evolution., , , and . GECCO Companion, page 1956-1962. ACM, (2023)Simulation-based analysis of FF behavior in presence of power supply noise., and . IOLTS, page 151-156. IEEE, (2017)A Case Study of Mixed-Signal Integrated Circuit Testing: An Application of Current Testing Using the Upper Limit and the Lower Limit., , and . ISCAS, page 77-80. IEEE, (1994)Ramp Voltage Testing for Detecting Interconnect Open Faults.. IEICE Trans. Inf. Syst., 91-D (3): 700-705 (2008)A BIC Sensor Capable of Adjusting IDDQ Limit in Tests., , , and . ATS, page 69-74. IEEE, (2006)