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Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology.

C. Lu, H. Lee, H. Chen, Y. Lin, Y. Chung, S. Wang, J. Yeh, V. Chang, M. Chiang, W. Chang, H. Chung, C. Cheng, H. Hsu, H. Liu, W. Chen, and C. Lin. VLSI Technology and Circuits, page 1-2. IEEE, (2023)

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Lin Lin

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Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology.C. Lu, H. Lee, H. Chen, Y. Lin, Y. Chung, S. Wang, J. Yeh, V. Chang, M. Chiang, W. Chang and 6 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2023)On the development of a fuzzy model for nonlinear systems.J. Lai, J. Shieh, and Y. Lin. IROS, page 943-949. IEEE, (1993)Ivermectin's Role in the Prevention of COVID-19: A Systematic Review and Meta-Analysis.G. Hu, C. Liang, P. Lin, and C. Lin. Journal of Clinical Pharmacology, (2023)Estimation of soil moisture dynamics using a recurrent dynamic learning neural network.Y. Tzeng, K. Fan, C. Lin, Y. Lee, and K. Chen. IGARSS, page 1251-1253. IEEE, (2012)Expert system for integrity assessment of piping containing defects.Y. Lin, and Y. Xie. Expert Syst. Appl., 30 (2): 149-155 (2006)A novel RF self test for a combo SoC on digital ATE with multi-site applications.C. Peng, C. Yang, A. Tsu, C. Tsai, Y. Chen, C. Lin, K. Hong, K. Kao, P. Liang, C. Tsai and 2 other author(s). ITC, page 1-8. IEEE Computer Society, (2014)Endurance > 1011 Cycling of 3D GAA Nanosheet Ferroelectric FET with Stacked HfZrO2 to Homogenize Corner Field Toward Mitigate Dead Zone for High-Density eNVM.C. Liao, K. Hsiang, Z. Lou, H. Tseng, C. Lin, Z. Li, F. Hsieh, C. Wang, F. Chang, W. Ray and 4 other author(s). VLSI Technology and Circuits, page 1-2. IEEE, (2022)An optimization approach for the fuzzy control of turning operations.Y. Tarng, C. Lin, and C. Nian. ANNES, page 145-148. IEEE Computer Society, (1995)Participant Selection Problem: Relative Performance of Five Optimization Solvers.C. Lin, J. Liu, K. Yeh, and E. Chu. ICCMS, page 24-31. ACM, (2017)The potential and limitations of automatic sentence extraction for summarizationC. Lin, and E. Hovy. Proceedings of the HLT-NAACL 03 on Text summarization workshop, page 73-80. Morristown, NJ, USA, Association for Computational Linguistics, (2003)

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Disambiguation of "Lin, Y. C."

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Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology.

Please choose a person to relate this publication to

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Lin, Y. C."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology.

Please choose a person to relate this publication to

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Lin Lin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
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URL
DOI
BibTeX
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APA
Chicago
DIN 1505
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Characterizing and Reducing the Layout Dependent Effect and Gate Resistance to Enable Multiple-Vt Scaling for a 3nm CMOS Technology.