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Disambiguation of "Gupta, Sandeep K."

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Benefits of a SoC-Specific Test Methodology.

, , and . IEEE Des. Test Comput., 20 (3): 68-77 (2003)

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Sandeep Gupta

Varun K Gupta

Sandeep Sadanandan

Sandeep Kumar

Sandeep Nambiar

 

Other publications of authors with the same name

Intention-to-treat concept: A review.. Perspectives in clinical research, 2 (3): 109-12 (July 2011)LR: 20130529; JID: 101551517; OID: NLM: PMC3159210; OTO: NOTNLM; ppublish;<m:linebreak></m:linebreak>Intention to treat.Threshold Testing: Improving Yield for Nanoscale VLSI., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (12): 1883-1895 (2009)Test embedding with discrete logarithms., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 14 (5): 554-566 (1995)ATPG for Heat Dissipation Minimization During Test Application., and . IEEE Trans. Computers, 47 (2): 256-262 (1998)BIST TPG for Combinational Cluster Interconnect Testing at Board Level., and . J. Electron. Test., 16 (5): 427-442 (2000)Introducing redundant computations in RTL data paths for reducing BIST resources., , and . ACM Trans. Design Autom. Electr. Syst., 6 (3): 423-445 (2001)Analysis and optimization of soft error tolerance strategies for real-time systems., , , and . CODES+ISSS, page 55-64. IEEE, (2015)Salvaging chips with caches beyond repair., , and . DATE, page 1263-1268. IEEE, (2012)An energy-aware fault tolerant scheduling framework for soft error resilient cloud computing systems., , , and . DATE, page 1-6. European Design and Automation Association, (2014)A New Gate Delay Model for Simultaneous Switching and Its Applications., , and . DAC, page 289-294. ACM, (2001)